Scanning Electron Microscope Substrate
Item Name Code (INC) 51464
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A black opaque item constructed of highly conductive like material designed for use in making ferrograms for microscopic examination.
Additional Information for Scanning Electron Microscope Substrate
Scanning Electron Microscope (SEM) substrates are specialized materials used in the field of microscopy. These substrates are designed to be compatible with SEM instruments, which are powerful tools used to study the surface morphology and composition of various samples at high magnification.
SEM substrates are typically made of conductive materials such as silicon, silicon dioxide, or gold-coated silicon. These materials allow for the efficient detection and analysis of electron signals during SEM imaging. The choice of substrate material depends on the specific requirements of the experiment or analysis being conducted.
SEM substrates are available in various forms, including discs, slides, grids, and chips. These substrates are often pre-cleaned and ready for use in SEM instruments. They may also come with specific features such as alignment marks or calibration standards to aid in sample positioning and measurement.
When selecting SEM substrates, it is important to consider factors such as substrate size, surface quality, conductivity, and compatibility with the SEM instrument being used. It is also essential to handle these substrates with care to avoid contamination or damage, as even minor defects can affect the quality of SEM imaging.
Overall, SEM substrates play a crucial role in enabling high-resolution imaging and analysis in the field of microscopy, particularly in applications such as materials science, nanotechnology, and biological research.
Related Item Names for INC 51464 Scanning Electron Microscope Substrate
NATO Stock Numbers with Item Name 51464 Scanning Electron Microscope Substrate Page 1 of 1
- EP074-0140
- RNCC: 3 | RNVC: 2 | DAC: 4
- 9432 020 13121
- RNCC: 3 | RNVC: 2 | DAC: 6