Probe Subassembly

Probe subassemblies are components used in electrical and electronic properties measuring and testing instruments. They are typically used to make electrical connections and measurements on electronic circuits or devices. These subassemblies consist of a probe tip, a cable or connector, and sometimes additional components such as shielding or filtering elements. They are designed to provide accurate and reliable measurements while minimizing interference or signal degradation. Probe subassemblies are commonly used in various industries, including electronics manufacturing, telecommunications, and research laboratories.