6625-01-662-8949

Electronic Systems Test Set Group

6625016628949 016628949 E2676B

A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets. View more Electronic Systems Test Set Group

6625-01-662-8949 TEST SET GROUP,ELECTRONIC SYSTEMS 6625016628949 016628949

Managed by United States
NSN Created on 20 Apr 2017
Data Last Changed
January 2023
NATO Update Count
1
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6625-01-662-8949 Demil Restrictions 6625-01-662-8949

DEMIL: A | DEMILI: 1 | CRITICALITY: X | HMIC: P | PMIC: A | EDC: A | ADPEC: 0

6625-01-662-8949 is a Electronic Systems Test Set Group that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

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