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6625-01-661-7230
Electronic Systems Test Set Group
6625016617230 016617230 PILOT 4D V8
A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets. View more Electronic Systems Test Set Group
January 2023
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Electronic Systems Test Set Group 016617230 United States (US) 4. 6625-01-661-7230 Marketplace Restrictions
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Restrictions 6625-01-661-7230
6625-01-661-7230 is a Electronic Systems Test Set Group that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Import and Export 6625-01-661-7230
- Schedule B
- Subscribe to View Schedule B
- HTS Code
- Subscribe to View HTS Code
End Users 6625-01-661-7230
- Republic of Korea (ZH01)
- Effective Date:
- 1 Mar 2017
Approved Sources 6625-01-661-7230
- Part Number
- Manufacturer
- Status
- PILOT 4D V8
- Manufacturer
- 3LEZ4 - Seica Inc (Active)
- Primary Buy
- Primary Buy
Datasheet 6625-01-661-7230
- Characteristic
- Specifications
- FIIG
- Specifications
- A23800
- Part Name Assigned By Controlling Agency [CXCY]
- Probe Test Platform
- Special Features [FEAT]
- 220 Volts
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Freight Information 6625-01-661-7230
6625-01-661-7230 has freight characteristics managed by the Republic of Korea.. 6625-01-661-7230 has a variance between NMFC and UFC when transported by rail and the description should be consulted.