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6625-01-416-2816
Semiconductor Device Test Set
6625014162816 014162816 T15410-1
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
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Related Documents 6625-01-416-2816 1+ Documents (More...)
/fsg-66/fsc-6625/us 6625-01-416-2816 Device Test Set 6625014162816 RQST NE Updated Every Day 6625-01
6625-01-416-2816 DEMIL: A | DEMILI Restrictions 6625-01-416-2816 DEMIL: A | DEMILI : | CRITICALITY :
Restrictions 6625-01-416-2816
6625-01-416-2816 is a Semiconductor Device Test Set This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Import and Export 6625-01-416-2816
- Schedule B
- Subscribe to View Schedule B
- HTS Code
- Subscribe to View HTS Code
End Users 6625-01-416-2816
- Spain (YB01)
- Effective Date:
- 1 Jul 1995
Approved Sources 6625-01-416-2816
- Part Number
- Manufacturer
- Status
- T15410-1
- Manufacturer
- 09651 - Miba Industrial Bearings U.S. Llc (Active)
- Original Design
- Original Design
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Freight Information 6625-01-416-2816
6625-01-416-2816 has freight characteristics.. 6625-01-416-2816 has a variance between NMFC and UFC when transported by rail and the description should be consulted.