6625-01-408-9364
Semiconductor Device Test Set
6625014089364 014089364 TRACKER 2040
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
Managed by United States
NSN Created on 1 Mar 1995
Data Last Changed
November 2023
November 2023
NATO Update Count
2
2
NATO Data Quality
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6625-01-408-9364 1+ Documents ( More... ) https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-01-408-9364
Semiconductor Device Test Set 6625014089364 TRACKER 2040 A test set specifically designed for use in
6625-01-408-9364 1+ Documents ( More... ) https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-01-408-9364
Semiconductor Device Test Set 6625014089364 TRACKER 2040 A test set specifically designed for use in
Restrictions 6625-01-408-9364
6625-01-408-9364 is a Semiconductor Device Test Set This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Approved Sources 6625-01-408-9364
- Part Number
- Manufacturer
- Status
- TRACKER 2040
- Manufacturer
- 57705 - Huntron Inc (Active)
- Primary Buy
- Primary Buy
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