Premium Information is available for this item - Upgrade for $1 a day
6625-01-302-6406
Semiconductor Device Test Set
6625013026406 013026406 4210
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
November 2023
8
Marketplace 6625-01-302-6406
Request a Quotation from participating marketplace vendors
Updated Every Day Updated Every Day 
Updated Every Day Related Documents 6625-01-302-6406 5+ Documents (More...)
Semiconductor Device Test Set 6625013026406 https//www.nsnlookup.com /nato/nato-stock-numbers/inc
Restrictions 6625-01-302-6406
6625-01-302-6406 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.
Approved Sources 6625-01-302-6406
- Part Number
- Manufacturer
- Status
- 4210
- Manufacturer
- 21066 - Wayne Kerr Electronics Inc (Replaced)
- Primary Buy
- Primary Buy