6625-01-272-5232

Test Set Subassembly

6625012725232 012725232 T-218446

6625-01-272-5232 TEST SET SUBASSEMBLY 6625012725232 012725232

Managed by United States
NSN Created on 10 Feb 1988
Data Last Changed
November 2023
NATO Update Count
5
NATO Data Quality
6625-01-272-5232 TEST SET SUBASSEMBLY 6625012725232 012725232 1/1
NSN 6625-01-272-5232 (Generic Image) 1/1

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6625-01-272-5232 Related Documents Related Documents 6625-01-272-5232 1+ Documents (More...)

DAC: A 1 Jan 1963 5961-01-192-7377 Transistor 932372-1RNCC: 3 | RNVC: 2 | DAC: A 25 Oct 1984 6625-01-272-5232

6625-01-272-5232 Demil Restrictions 6625-01-272-5232

DEMIL: A | DEMILI: | CRITICALITY: | HMIC: P | PMIC: U | EDC: | ADPEC:

6625-01-272-5232 is a Test Set Subassembly This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.

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