6625-01-231-7845
Semiconductor Device Test Set
6625012317845 012317845 AFIT3000C
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
November 2023
7
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Restrictions 6625-01-231-7845
6625-01-231-7845 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Approved Sources 6625-01-231-7845
- Part Number
- Manufacturer
- Status
- AFIT3000C
- Manufacturer
- 51089 - Fairchild Semiconductor Corp (Obsolete)
- Primary Buy
- Primary Buy
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