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6625-01-221-3700
Semiconductor Device Test Set
6625012213700 012213700
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Managed by United States
NSN Created on 28 Nov 1985
Data Last Changed
November 2023
November 2023
NATO Update Count
3
3
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Related Documents 6625-01-221-3700 2+ Documents (More...)
RQST Updated Every Day 6625-01-221-3700 RQST NE Related Documents 6625-01-221-3700 2+ Documents
Set 6625012213700 RQST Updated Every Day 6625-01-221-3700 RQST NE Related Documents 6625-01-221-3700
2+ Documents Set 6625012213700 RQST Updated Every Day 6625-01-221-3700 RQST NE Related Documents 6625
Set 6625012213700 RQST Updated Every Day 6625-01-221-3700 RQST NE Related Documents 6625-01-221-3700
2+ Documents Set 6625012213700 RQST Updated Every Day 6625-01-221-3700 RQST NE Related Documents 6625
United States (US) 4. 6625-01-239-4638 Marketplace https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-01-221-3700
Semiconductor Device Test Set 6625012213700 SET,SEMICONDUCTOR DEVICE 22 EA NS Request Quotation
Semiconductor Device Test Set 6625012213700 SET,SEMICONDUCTOR DEVICE 22 EA NS Request Quotation
Restrictions 6625-01-221-3700
6625-01-221-3700 is a Semiconductor Device Test Set This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Management Data 6625-01-221-3700
- Effective Date
- Organization
- Unit of Issue
- Unit Price
- Qty Unit Pack
- Unit of Issue
- Oct 1994
- Department of the Air Force (DF)
- EA
- Subscribe
- 1
- EA
- MOE
- USC
- Code
- Statement
- Order of Use
- Jump To Code
- Qty Per Assy
- UOM
- Technical Document
- Quantative Expression
- Code
- Department of the Air Force (DF)
- L
- A
- Consolidated With 6625-01-239-4638
- A
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