6625-01-178-0966

Electronic Systems Test Set Group

6625011780966 011780966 315700-1

A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets. View more Electronic Systems Test Set Group

6625-01-178-0966 TEST SET GROUP,ELECTRONIC SYSTEMS 6625011780966 011780966

Managed by United States
NSN Created on 2 May 1984
Data Last Changed
November 2023
NATO Update Count
7
NATO Data Quality
6625-01-178-0966 TEST SET GROUP,ELECTRONIC SYSTEMS 6625011780966 011780966 1/1
NSN 6625-01-178-0966 (Generic Image) 1/1

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6625-01-178-0966 Demil Restrictions 6625-01-178-0966

DEMIL: F | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: U | EDC: | ADPEC: 0

6625-01-178-0966 is a Electronic Systems Test Set Group that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is a US Munitions List or Commerce Control List Item where the Item Manager, Equipment Specialist or Product Specialist must provide special demilitarization instructions. This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.

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