6625-01-127-4105

Semiconductor Device Test Set

6625011274105 011274105

6625-01-127-4105 TEST SET,SEMICONDUCTOR DEVICE 6625011274105 011274105

Managed by United States
NSN Created on 27 Feb 1982
Data Last Changed
November 2023
NATO Update Count
5
NATO Data Quality
6625-01-127-4105 TEST SET,SEMICONDUCTOR DEVICE 6625011274105 011274105 1/1
NSN 6625-01-127-4105 (Generic Image) 1/1

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6625-01-127-4105 Demil Restrictions 6625-01-127-4105

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: A | EDC: A | ADPEC: 0

6625-01-127-4105 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

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