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6625-01-034-0940
Semiconductor Device Test Set
6625010340940 010340940 1249
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
November 2023
7
Marketplace 6625-01-034-0940
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Related Documents 6625-01-034-0940 2+ Documents (More...)
United States (US) 4. 6625-01-034-0940 Marketplace Restrictions Approved Sources Datasheet Management
DEVICE RQST NS Request Quotation Updated Every Day 6625-01-034-0940 RQST NE Updated Every Day 6625-01
Restrictions 6625-01-034-0940
6625-01-034-0940 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.
Approved Sources 6625-01-034-0940
- Part Number
- Manufacturer
- Status
- 1249
- Manufacturer
- 9Y504 - Electro Scientific Industries Inc (Active)
- Primary Buy
- Primary Buy
- 1249
- 11837 - Electro Scientific Industries Inc (Replaced)
- Canceled/Obsolete
- Canceled/Obsolete
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