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6625-00-926-1341

Semiconductor Device Test Set

6625009261341 009261341 3

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-926-1341 TEST SET,SEMICONDUCTOR DEVICE 6625009261341 009261341

Managed by United States
NSN Created on 13 Apr 1966
Data Last Changed
January 2023
NATO Update Count
7
NATO Data Quality
6625-00-926-1341 TEST SET,SEMICONDUCTOR DEVICE 6625009261341 009261341 1/1
NSN 6625-00-926-1341 (Generic Image) 1/1

6625-00-926-1341 Stock and Availability Marketplace 6625-00-926-1341

6625-00-926-1341 Related Documents Related Documents 6625-00-926-1341 5+ Documents (More...)

Vendor Details... 3 TEST SET,SEMICONDUCTOR DEVICE 1 EA NS Request Quotation Updated Every Day 6625-00
-926-1341 RQST NE Updated Every Day 6625-00-926-1341 RQST Updated Every Day 6625-00-926-1341 RQST NE
/us 6625-00-926-1341 Semiconductor Device Test Set 6625009261341 Vendor Details... 3 TEST SET,SEMICONDUCTOR

6625-00-926-1341 Demil Restrictions 6625-00-926-1341

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: U | EDC: | ADPEC: 0

6625-00-926-1341 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.

6625-00-926-1341 HTS and ScheduleB Import and Export 6625-00-926-1341

6625-00-926-1341 End Users End Users 6625-00-926-1341

Canada (ZC01)
Effective Date:
1 Apr 1991

6625-00-926-1341 Manufacturers Approved Sources 6625-00-926-1341

6625-00-926-1341 Technical Data Datasheet 6625-00-926-1341

Characteristic
Specifications
FIIG
T228-A
Test Type For Which Designed [AQXY]
Ac Current Gain; Saturation; Leakage Current
Operating Test Capability [AQXZ]
Ac Current Gain Range 3 To 100 And 30 To 1000,Ac Test Freq 1 Khz Porm 10 Pct Of Total; Saturation Voltage Range 0.3 To 3V Full Scale; Leakage Current Range 0.03,0.3,3 Or 30 Ma Full Scale At 6V
Dc Voltage Rating [ACYR]
13.5 Volts Nominal
Internal Battery Accommodation [ALSF]
Included
Inclosure Feature [ANPZ]
Single Item W/Carrying Case
Material And Location [ANNQ]
Aluminum Carrying Case
Height [HGTH]
6.000 Inches Nominal
Length [ABRY]
9.000 Inches Nominal
Width [ABGL]
6.000 Inches Nominal
Major Components [AEAS]
Adapter,Transistor
Accessory Component Quantity [AFHS]
1
Accessory Controlling Agency [AKVY]
Test Equipment Corp
Accessory Identifying Number [AKVZ]
Ta-1 Part No.

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6625-00-926-1341 Freight Data Freight Information 6625-00-926-1341

6625-00-926-1341 has freight characteristics.. 6625-00-926-1341 has a variance between NMFC and UFC when transported by rail and the description should be consulted.