6625-00-805-0927

Semiconductor Device Test Set

6625008050927 008050927

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-805-0927 TEST SET,SEMICONDUCTOR DEVICE 6625008050927 008050927

Managed by United States
NSN Created on 1 Jan 1962
Data Last Changed
November 2023
NATO Update Count
8
NATO Data Quality
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6625-00-805-0927 Demil Restrictions 6625-00-805-0927

DEMIL: A | DEMILI: 1 | CRITICALITY: X | HMIC: P | PMIC: A | EDC: A | ADPEC: 0

6625-00-805-0927 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

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