Premium Information is available for this item - Upgrade for $1 a day

6625-00-799-7814

Semiconductor Device Test Set

6625007997814 007997814

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-799-7814 TEST SET,SEMICONDUCTOR DEVICE 6625007997814 007997814

Managed by United States
NSN Created on 1 Jan 1963
Data Last Changed
November 2023
NATO Update Count
11
NATO Data Quality
6625-00-799-7814 TEST SET,SEMICONDUCTOR DEVICE 6625007997814 007997814 1/1
NSN 6625-00-799-7814 (Generic Image) 1/1

6625-00-799-7814 Stock and Availability Marketplace 6625-00-799-7814

Need Help?
Request a Quotation from participating marketplace vendors
eBay Updated Every Day
6625-00-799-7814 RQST eBay
Amazon Updated Every Day
6625-00-799-7814 RQST NE Amazon

6625-00-799-7814 Related Documents Related Documents 6625-00-799-7814 5+ Documents (More...)

Set 6625007997814 RQST Updated Every Day 6625-00-799-7814 RQST NE Related Documents 6625-00-799-7814
5+ Documents Set 6625007997814 RQST Updated Every Day 6625-00-799-7814 RQST NE Related Documents 6625
-00-799-7814 5+ Documents Set 6625007997814 United States (US) 4. 6625-00-799-7814 Marketplace Restrictions
Semiconductor Device Semiconductor Device Test Set 6625661327328 Semiconductor Device Test Set 6625007997814
6625661327328 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-799-7814 Semiconductor Device Test
Set 6625007997814 6625-00-799-7814 Marketplace Restrictions Approved https//www.nsnlookup.com /fsg-66
Set 6625251272049 Device Test Set 6625251272049 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-799-7814
Semiconductor Device Test Set 6625007997814 Semiconductor Device Test Set 6625007997814 https https
66252512720496625251272049 Semiconductor Device Test Set 6625251272049 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-799-7814
Set 6625013166512 Device Test Set 6625251189101 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-799-7814
Semiconductor Device Test Set 6625007997814 6625661327328 Semiconductor Device Test Set 6625007997814
https Semiconductor Device Test Set 6625981053536 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-799-7814
Semiconductor Device Test Set 6625007997814 6625-25-118-9101 Semiconductor Device Test Set 6625251189101
https Semiconductor Device Test Set 6625981053536 www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-799-7814

6625-00-799-7814 Demil Restrictions 6625-00-799-7814

DEMIL: A | DEMILI: 1 | CRITICALITY: X | HMIC: P | PMIC: A | EDC: A | ADPEC: 0

6625-00-799-7814 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

6625-00-799-7814 Similar Items Similar Supply Items to 6625-00-799-7814