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6625-00-777-2091
Semiconductor Device Test Set
6625007772091 007772091
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
November 2023
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Related Documents 6625-00-777-2091 5+ Documents (More...)
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66/fsc-6625/fr 6625-14-337-0938 Semiconductor Device Test Set 6625143370938 6625-01-316-6512 6625-00-777-2091
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Semiconductor Device Test Set 6625007772091 Test Set 6625143236349 Semiconductor Device Test Set
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Test Set 6625140414955 362-3839 6625-00-844-7105 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-777-2091
Semiconductor Device Test Set 6625007772091 337-0938 Semiconductor Device Test Set 6625143370938
Restrictions 6625-00-777-2091
6625-00-777-2091 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Management Data 6625-00-777-2091
- Effective Date
- Organization
- Unit of Issue
- Unit Price
- Qty Unit Pack
- Unit of Issue
- Nov 2002
- Department of the Air Force (DF)
- EA
- Subscribe
- 1
- EA
- MOE
- USC
- Code
- Statement
- Order of Use
- Jump To Code
- Qty Per Assy
- UOM
- Technical Document
- Quantative Expression
- Code
- Department of the Air Force (DF)
- L
- Z
- Discontinued-Use 6625-00-902-5583
- Z
Air Force
- Budget:
- M
- 57X3080 - Other Base Maintenance and Support Equipment
- Aggregation Code:
- RH
- AUTO TEST EQUIPMENT/AUTO TEST SYSTEMS (ATE/ATS) (FSC RESIDUAL MMAC)
- Price Validation Code:
- N
- The current standard price in Catalog Management Data (CMD) has not analyzed or coded for LP/LM.
The price has not been analyzed or reviewed for accuracy.
ZOP or Standard price challenges are permissible but must be supported with adequate justification. However, if coded for Local Purchase (LP) or Fabrication/Manufacture as indicated with an (LM) Acquisition Advice Code of “L” or “F”, then it must be evaluated locally where purchased or fabricated.
- Expendability
Recoverability
Repairability: - S
- Reparable. Condemn at Depot. AF Equipment Management System (AFEMS).