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6625-00-777-2091

Semiconductor Device Test Set

6625007772091 007772091

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-777-2091 TEST SET,SEMICONDUCTOR DEVICE 6625007772091 007772091

Managed by United States
NSN Created on 1 Jan 1963
Data Last Changed
November 2023
NATO Update Count
5
NATO Data Quality
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6625-00-777-2091 Demil Restrictions 6625-00-777-2091

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: A | EDC: | ADPEC: 0

6625-00-777-2091 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

6625-00-777-2091 Management Data Management Data 6625-00-777-2091

Effective Date
Organization
Unit of Issue
Unit Price
Qty Unit Pack
Nov 2002
Department of the Air Force (DF)
EA
Subscribe
1
MOE
USC
Code
Statement
Order of Use
Jump To Code
Qty Per Assy
UOM
Technical Document
Quantative Expression
Department of the Air Force (DF)
L
Z
Discontinued-Use 6625-00-902-5583

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