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6625-00-701-9552
Semiconductor Device Test Set
6625007019552 007019552
Managed by United States
NSN Created on 1 Jan 1963
Data Last Changed
November 2023
November 2023
NATO Update Count
8
8
NATO Data Quality
Marketplace 6625-00-701-9552
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Related Documents 6625-00-701-9552 1+ Documents (More...)
United States (US) 4. 6625-00-701-9552 Marketplace Restrictions Approved Sources Datasheet Management
GP-4 TEST SET,SEMICONDUCTOR DEVICE 1 EA NS Request Quotation Updated Every Day 6625-00-701-9552 RQST
Updated Every Day 6625-00-701-9552 RQST NE Related Documents 6625-00-701-9552 1+ Documents ( More...
GP-4 TEST SET,SEMICONDUCTOR DEVICE 1 EA NS Request Quotation Updated Every Day 6625-00-701-9552 RQST
Updated Every Day 6625-00-701-9552 RQST NE Related Documents 6625-00-701-9552 1+ Documents ( More...
Restrictions 6625-00-701-9552
6625-00-701-9552 is a Semiconductor Device Test Set This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
Management Data 6625-00-701-9552
- Effective Date
- Organization
- Unit of Issue
- Unit Price
- Qty Unit Pack
- Unit of Issue
- Jan 2000
- Department of the Air Force (DF)
- EA
- Subscribe
- 1
- EA
- MOE
- USC
- Code
- Statement
- Order of Use
- Jump To Code
- Qty Per Assy
- UOM
- Technical Document
- Quantative Expression
- Code
- Department of the Air Force (DF)
- L
- N
- Disposal
- N
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