6625-00-649-4702
Semiconductor Device Test Set
6625006494702 006494702
Cancelled - Replaced by NSN 6625-00-643-3437 effective 1 Jan 1960
Managed by United States
Data Last Changed
January 2024
January 2024
NATO Update Count
2
2
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006494702 Cancelled - Replaced by NSN 6625-00-643-3437 Instruments from United States (US) 6625-00-649
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Restrictions 6625-00-649-4702
6625-00-649-4702 is a Semiconductor Device Test Set This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.
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