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6625-00-643-3437

Semiconductor Device Test Set

6625006433437 006433437

6625-00-643-3437 TEST SET,SEMICONDUCTOR DEVICE 6625006433437 006433437

Managed by United States
Data Last Changed
November 2023
NATO Update Count
2
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NSN 6625-00-643-3437 (Generic Image) 1/1

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6625-00-643-3437 Demil Restrictions 6625-00-643-3437

DEMIL: A | DEMILI: | CRITICALITY: | HMIC: P | PMIC: U | EDC: | ADPEC:

6625-00-643-3437 is a Semiconductor Device Test Set This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.

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