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6625-00-540-4564

Semiconductor Device Test Set

6625005404564 005404564 716A

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-540-4564 TEST SET,SEMICONDUCTOR DEVICE 6625005404564 005404564

Managed by United States
NSN Created on 28 Sep 1974
Data Last Changed
November 2023
NATO Update Count
5
NATO Data Quality
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NSN 6625-00-540-4564 (Generic Image) 1/1

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716A A test set specifically designed for use in making examinations of diodes, transistors, and the
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6625-00-540-4564 Demil Restrictions 6625-00-540-4564

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: U | EDC: | ADPEC: 0

6625-00-540-4564 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.

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