6625-00-409-8170

Test Set Subassembly

6625004098170 004098170 01-P03187B001

6625-00-409-8170 TEST SET SUBASSEMBLY 6625004098170 004098170

Managed by United States
NSN Created on 10 Nov 1984
Data Last Changed
November 2023
NATO Update Count
5
NATO Data Quality
6625-00-409-8170 TEST SET SUBASSEMBLY 6625004098170 004098170 1/1
NSN 6625-00-409-8170 (Generic Image) 1/1

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6625-00-409-8170 Related Documents Related Documents 6625-00-409-8170 1+ Documents (More...)

1979 5998-00-434-5653 Circuit Card Assembly 01P02942B001RNCC: 3 | RNVC: 9 | DAC: 6 17 Aug 1970 6625-00-409-8170

6625-00-409-8170 Demil Restrictions 6625-00-409-8170

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: A | EDC: | ADPEC: 0

6625-00-409-8170 is a Test Set Subassembly that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

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