6625-00-327-2346

Electronic Systems Test Set Group

6625003272346 003272346

A test set specifically designed for use in making examinations and providing discrete evaluations of the overall performance of a system(s) or subsystem. A system consists of two or more sets, a subsystem is grouping of two or more sets. View more Electronic Systems Test Set Group

6625-00-327-2346 TEST SET GROUP,ELECTRONIC SYSTEMS 6625003272346 003272346

Managed by United States
NSN Created on 3 Dec 1973
Data Last Changed
November 2023
NATO Update Count
3
NATO Data Quality
6625-00-327-2346 TEST SET GROUP,ELECTRONIC SYSTEMS 6625003272346 003272346 1/1
NSN 6625-00-327-2346 (Generic Image) 1/1

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6625-00-327-2346 Demil Restrictions 6625-00-327-2346

DEMIL: A | DEMILI: | CRITICALITY: N | HMIC: P | PMIC: A | EDC: | ADPEC:

6625-00-327-2346 is a Electronic Systems Test Set Group This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

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