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6625-00-305-1444
Semiconductor Device Test Set
6625003051444 003051444 6200B
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
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Set 6625003051444 DEVICE 1 EA NS Request Quotation Updated Every Day 6625-00-305-1444 RQST NE Updated
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6200B OPTION 003 6200B/003 Managed by United Kingdom NSN Created on 5 Dec 1997 Data Last Changed January
Semiconductor Device Test Set 6625003051444 6200B OPTION 003 6200B/003 Managed by United Kingdom
/003 Managed by United Kingdom NSN Created on 5 Dec 1997 Data Last Changed January 6200B 6200B OPTION
003 6200B/003 Managed by United Kingdom NSN Created on 5 Dec 1997 Data Last Changed January 003 6200B
6200B OPT 001+OPT 002 A test set specifically designed for use in making examinations and providing
Semiconductor Device Test Set 6625003051444 Upgrade your Account Upgrade 6625-00-305-1444Semiconductor
6200B OPTION 003 6200B/003 Managed by United Kingdom NSN Created on 5 Dec 1997 Data Last Changed January
/003 Managed by United Kingdom NSN Created on 5 Dec 1997 Data Last Changed January 003 6200B Microwave
Restrictions 6625-00-305-1444
6625-00-305-1444 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.
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