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6625-00-188-5851

Semiconductor Device Test Set

6625001885851 001885851 R16ANTS286U TS268U

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-188-5851 TEST SET,SEMICONDUCTOR DEVICE 6625001885851 001885851

Managed by United States
NSN Created on 1 Jan 1963
Data Last Changed
January 2023
NATO Update Count
23
NATO Data Quality
6625-00-188-5851 TEST SET,SEMICONDUCTOR DEVICE 6625001885851 001885851 1/1
NSN 6625-00-188-5851 (Generic Image) 1/1

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6625-00-188-5851 Related Documents Related Documents 6625-00-188-5851 5+ Documents (More...)

6625988574593 148-1074 Semiconductor Device Test 323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
-5070 Semiconductor Device Test Set 6625251157100 323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
-5070 Semiconductor Device Test Set 6625251344452 323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
Set 6625121538396 DAC 5 6625-01230 337-0938 6625-14-323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
6625-25-114-5070 Set 6625997912989 337-0938 6625-14-323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
Set 6625121538396 DAC 5 6625-01230 337-0938 6625-14-323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
Set 6625121538396 DAC 5 6625-01230 337-0938 6625-14-323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
6625-25-114-5070 Set 6625997912989 337-0938 6625-14-323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
Semiconductor Device Test Set 6625001885851 6625251145070 Set 6625121538396 DAC 5 6625-01230 337
6625/no 6625-25-148-1074 Semiconductor Device Test 323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
-7100 Semiconductor Device Test Set 6625251157100 323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
-4452 Semiconductor Device Test Set 6625251344452 323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
/no 6625-25-148-1074 Semiconductor Device Test Set 6625251481074 323-6349 6625-25-145-3980 Set 6625001885851
Set 6625121538396 DAC 5 6625-01230 337-0938 6625-14-323-6349 6625-25-145-3980 6625-14-420-8649 6625-00-188-5851
6625-25-114-5070 Semiconductor Device Test Set 6625251157100 323-6349 6625-25-145-3980 -8649 6625-00-188-5851

6625-00-188-5851 Demil Restrictions 6625-00-188-5851

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: A | EDC: | ADPEC: 0

6625-00-188-5851 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

6625-00-188-5851 HTS and ScheduleB Import and Export 6625-00-188-5851

6625-00-188-5851 End Users End Users 6625-00-188-5851

Brazil (YA01)
Effective Date:
1 Dec 1999
Spain (YB01)
Effective Date:
1 Apr 1991
Singapore (YJ01)
Effective Date:
1 Apr 1991
Australia (ZA01)
Effective Date:
1 Jun 1998
France (ZF01)
Effective Date:
1 Apr 1991
Republic of Korea (ZH01)
Effective Date:
1 Apr 1991
Denmark (ZS01)
Effective Date:
1 Apr 1991
Greece (ZU01)
Effective Date:
1 Apr 1991
Turkey (ZW01)
Effective Date:
1 Nov 2005

6625-00-188-5851 Manufacturers Approved Sources 6625-00-188-5851

6625-00-188-5851 Technical Data Datasheet 6625-00-188-5851

Characteristic
Specifications
FIIG
T228-A
Test Type For Which Designed [AQXY]
Testing From Resistance,Back Resistance And Back Conductance Of Jan Crystals
Operating Test Capability [AQXZ]
Indicated Res 500 Ohms For Good Crystals; Res Ratio 10 To 1 For Good Crystals
Internal Battery Accommodation [ALSF]
Included
Inclosure Feature [ANPZ]
Single Item W/Carrying Case
Material And Location [ANNQ]
Aluminum Carrying Case
Height [HGTH]
2.625 Inches Nominal
Length [ABRY]
7.375 Inches Nominal
Width [ABGL]
4.375 Inches Nominal
Nondefinitive Spec/Std Data [ZZZT]
No. Ts-268/U Series Type

6625-00-188-5851 Related Items NATO Stock Numbers Related to 6625-00-188-5851

6625-00-188-5851 Freight Data Freight Information 6625-00-188-5851

6625-00-188-5851 has freight characteristics.It has a National Motor Freight Classification (NMFC) of 061700. A Sub NMFC of X. It has a NMFC Description of ELEC APPLIANCES/INSTRUMENTS NOI. 6625-00-188-5851 is rated as class 100 when transported by Less-Than Truckload (LTL) freight. 6625-00-188-5851 is rated as class 77.5 when transported by Less-Than Carload (LCL) rail or ocean freight. It has a Uniform Freight Classification (UFC) number of 34580 which rates the freight between FCL and LCL. It has a Water Commodity Code (WCC) of 738 for ocean manifesting and military sealift. 6625-00-188-5851 is not classified as a special type of cargo when transported by water. 6625-00-188-5851 is not a consolidation and does not exceed 84" in any dimension. It should be compatible with a standard 72" Aircraft Cargo Door when transported by air.

6625-00-188-5851 Packaging Data Packaging Data 6625-00-188-5851

Responsible Activity
Packaging Data Source
Primary Inventory Control Activity (PICA)
Packaging Data does not meet current MIL-STD-2073-1E

Item Pack Level (Unpackaged)

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Item Weight
Characteristics
Weight/Dimensions Category
Fragility
Item Preservation
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Unit Pack Level (Packaged)

Quantity per Pack
Unit Size
Unit Weight
Unit Cube
Preservation Method
Cleaning/Drying
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Any Suitable Process
Preservation Material
Wrapping Material
Cushioning/Dunnage
Cushioning Thickness
Container
Special Marking
No Requirement
MIL-DTL-17667, Neutral Wrapping Paper
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ASTM-D5118, Type CF, Class Domestic, Corrugated Fiberboard Box
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Intermediate Pack Level

Quantity of Unit Packs
Container
No Requirement