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6625-00-116-5867
Test Probe
6625001165867 001165867 810002-752 3082
An item which is designed to be attached to but does not include a wire or cable. It is used in the testing of electric or electronic circuits. Electronic components such as capacitors, electron tube, resistors, semiconductor devices and the like are mounted into and included with the item. Excludes PROBE-LEAD ASSEMBLY, TEST and TEST PROBE ATTACHMENT. View more Test Probe
November 2023
8
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Restrictions 6625-00-116-5867
6625-00-116-5867 is a Test Probe that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.
Approved Sources 6625-00-116-5867
- Part Number
- Manufacturer
- Status
- 3082
- Manufacturer
- 4U744 - Fluke Electronics Corp (Active)
- Primary Buy
- Primary Buy
- 810002-752
- 12436 - Bae Systems Information And (Active)
- Secondary Buy
- Secondary Buy
- 3082
- 05276 - Fluke Electronics Corp (Replaced)
- Canceled/Obsolete
- Canceled/Obsolete
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