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6625-00-109-8272

Semiconductor Device Test Set

6625001098272 001098272 96225 92101

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-109-8272 TEST SET,SEMICONDUCTOR DEVICE 6625001098272 001098272

Managed by United States
NSN Created on 2 Aug 1968
Data Last Changed
November 2023
NATO Update Count
6
NATO Data Quality
6625-00-109-8272 TEST SET,SEMICONDUCTOR DEVICE 6625001098272 001098272 1/1
NSN 6625-00-109-8272 (Generic Image) 1/1

6625-00-109-8272 Stock and Availability Marketplace 6625-00-109-8272

6625-00-109-8272 Related Documents Related Documents 6625-00-109-8272 5+ Documents (More...)

96225 92101 A test set specifically designed for use in making examinations of diodes, transistors,
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6625-00-109-8272 Demil Restrictions 6625-00-109-8272

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: A | EDC: A | ADPEC: 0

6625-00-109-8272 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

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