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6625-00-007-3501

Semiconductor Device Test Set

6625000073501 000073501 TR115

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-007-3501 TEST SET,SEMICONDUCTOR DEVICE 6625000073501 000073501

Managed by United States
NSN Created on 30 Jun 1972
Data Last Changed
November 2023
NATO Update Count
6
NATO Data Quality
6625-00-007-3501 TEST SET,SEMICONDUCTOR DEVICE 6625000073501 000073501 1/1
NSN 6625-00-007-3501 (Generic Image) 1/1

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6625-00-007-3501 Demil Restrictions 6625-00-007-3501

DEMIL: A | DEMILI: 1 | CRITICALITY: X | HMIC: P | PMIC: U | EDC: A | ADPEC:

6625-00-007-3501 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. Demilitarization of this item has been confirmed and is not currently subject to changes. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. The precious metals content of this item is unknown.

6625-00-007-3501 Manufacturers Approved Sources 6625-00-007-3501

6625-00-007-3501 Management Data Management Data 6625-00-007-3501

Effective Date
Organization
Unit of Issue
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Qty Unit Pack
Apr 2014
Department of the Air Force (DF)
EA
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1
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USC
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Jump To Code
Qty Per Assy
UOM
Technical Document
Quantative Expression
Department of the Air Force (DF)
L
N
Disposal

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