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6625-00-003-7026

Semiconductor Device Test Set

6625000037026 000037026 181512

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-003-7026 TEST SET,SEMICONDUCTOR DEVICE 6625000037026 000037026

Managed by United States
NSN Created on 19 May 1972
Data Last Changed
November 2023
NATO Update Count
8
NATO Data Quality
6625-00-003-7026 TEST SET,SEMICONDUCTOR DEVICE 6625000037026 000037026 1/1
NSN 6625-00-003-7026 (Generic Image) 1/1

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6625-00-003-7026 Demil Restrictions 6625-00-003-7026

DEMIL: B | DEMILI: 3 | CRITICALITY: X | HMIC: P | PMIC: A | EDC: A | ADPEC: 9

IUID Required

6625-00-003-7026 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item has been confirmed as a Critical Munitions List Item or a Sensitive Commerce Control List Item and cannot be in the possession of any party anywhere in the World who is not an authorized NATO Government. Any other possessor of this item should mutilate it now as possession violates international and local laws. This item is a US Munitions List Item and must be mutilated to scrap. This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal. This item contains or is related to automatic data processing equipment.

6625-00-003-7026 Manufacturers Approved Sources 6625-00-003-7026

6625-00-003-7026 Management Data Management Data 6625-00-003-7026

Effective Date
Organization
Unit of Issue
Unit Price
Qty Unit Pack
Dec 2016
Department of the Air Force (DF)
EA
Subscribe
1
MOE
USC
Code
Statement
Order of Use
Jump To Code
Qty Per Assy
UOM
Technical Document
Quantative Expression
Department of the Air Force (DF)
L
N
Disposal

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