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6625-00-003-7026
Semiconductor Device Test Set
6625000037026 000037026 181512
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
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November 2023
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Restrictions 6625-00-003-7026
IUID Required
6625-00-003-7026 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item has been confirmed as a Critical Munitions List Item or a Sensitive Commerce Control List Item and cannot be in the possession of any party anywhere in the World who is not an authorized NATO Government. Any other possessor of this item should mutilate it now as possession violates international and local laws. This item is a US Munitions List Item and must be mutilated to scrap. This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal. This item contains or is related to automatic data processing equipment.
Approved Sources 6625-00-003-7026
- Part Number
- Manufacturer
- Status
- 181512
- Manufacturer
- 18338 - Xerox Corp Xerox Documentation And (Obsolete)
- Original Design
- Original Design
Management Data 6625-00-003-7026
- Effective Date
- Organization
- Unit of Issue
- Unit Price
- Qty Unit Pack
- Unit of Issue
- Dec 2016
- Department of the Air Force (DF)
- EA
- Subscribe
- 1
- EA
- MOE
- USC
- Code
- Statement
- Order of Use
- Jump To Code
- Qty Per Assy
- UOM
- Technical Document
- Quantative Expression
- Code
- Department of the Air Force (DF)
- L
- N
- Disposal
- N
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