6625-99-953-2067

Semiconductor Device Test Set

6625999532067 999532067 AA00-3606-01

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-99-953-2067 TEST SET,SEMICONDUCTOR DEVICE 6625999532067 999532067

Managed by United Kingdom
NSN Created on 25 Apr 1991
Data Last Changed
January 2023
NATO Update Count
1
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