6625-99-949-0872

Semiconductor Device Test Set

6625999490872 999490872 K114 40695B Z4ZD05171

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

Managed by United Kingdom

NSN Created on 25 Apr 1991

Data Last Changed
January 2023

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1

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6625-99-949-0872 Semiconductor Device Test Set 6625999490872

K114 40695B Z4ZD05171 A test set specifically designed for use in making examinations of diodes, transistors
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