6625-99-628-8755

Semiconductor Device Test Set

6625996288755 996288755 CT71

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

Managed by United Kingdom

NSN Created on 25 Apr 1991

Data Last Changed
January 2023

NATO Update Count
1

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