6625-98-850-2776
Semiconductor Device Test Set
6625988502776 988502776 259C
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
Managed by New Zealand
NSN Created on 12 Feb 1976
Data Last Changed
January 2023
January 2023
NATO Update Count
1
1
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- New Zealand (ZE)
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- 259C
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- 24624 - American Electronic Laboratories Inc (Replaced)
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