6625-25-138-3475

Semiconductor Device Test Set

6625251383475 251383475 AS500

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-25-138-3475 TEST SET,SEMICONDUCTOR DEVICE 6625251383475 251383475

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NSN Created on 12 Feb 1990
Data Last Changed
January 2023
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