6625-14-420-8649

Semiconductor Device Test Set

6625144208649 144208649 20064392

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-420-8649 TEST SET,SEMICONDUCTOR DEVICE 6625144208649 144208649

Managed by France
NSN Created on 16 Dec 1987
Data Last Changed
January 2023
NATO Update Count
1
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6625-14-420-8649 is a Semiconductor Device Test Set

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