6625-14-361-1428
Semiconductor Device Test Set
6625143611428 143611428 301-5570-8 301-5570-6
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
Managed by France
NSN Created on 24 Jan 1980
Data Last Changed
January 2023
January 2023
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Approved Sources 6625-14-361-1428
- Part Number
- Manufacturer
- Status
- 301-5570-8
- Manufacturer
- F2821 - Entrelec Industries (Replaced)
- Primary Buy
- Primary Buy
- 301-5570-6
- F2821 - Entrelec Industries (Replaced)
- Secondary Buy
- Secondary Buy
NATO Stock Numbers Related to 6625-14-361-1428
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