6625-14-361-1428

Semiconductor Device Test Set

6625143611428 143611428 301-5570-8 301-5570-6

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-361-1428 TEST SET,SEMICONDUCTOR DEVICE 6625143611428 143611428

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NSN Created on 24 Jan 1980
Data Last Changed
January 2023
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6625-14-361-1428 is a Semiconductor Device Test Set

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