6625-14-308-9164

Semiconductor Device Test Set

6625143089164 143089164 5999965 PL610528 BE-191A

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-308-9164 TEST SET,SEMICONDUCTOR DEVICE 6625143089164 143089164

Managed by France
NSN Created on 1 Jan 1974
Data Last Changed
January 2023
NATO Update Count
1
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6625-14-308-9164 Semiconductor Device Test Set 6625143089164
5999965 PL610528 BE-191A A test set specifically designed for use in making examinations of diodes,
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6625-14-308-9164 is a Semiconductor Device Test Set

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Part Number
Manufacturer
Status
5999965
F6207 - L.C.T. (Laboratoire Central De (Replaced)
Canceled/Obsolete
RNCC 5 RNVC 9 DAC 3
PL610528
F6207 - L.C.T. (Laboratoire Central De (Replaced)
Canceled/Obsolete
RNCC 5 RNVC 9 DAC 1
BE-191A
F5312 - Cimd (Centre D'identification Des (Active)
NATO Reference
RNCC 6 RNVC 9 DAC 9

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