6625-14-308-9164

Semiconductor Device Test Set

6625143089164 143089164 5999965 PL610528 BE-191A

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-308-9164 TEST SET,SEMICONDUCTOR DEVICE 6625143089164 143089164

Managed by France
NSN Created on 1 Jan 1974
Data Last Changed
January 2023
NATO Update Count
1
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6625-14-308-9164 Related Documents Related Documents 6625-14-308-9164 5+ Documents (More...)

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Upgrade for $1 a day Upgrade your Account Upgrade 6130-01-101-1931Power Supply6130011011931 011011931 191A
Semiconductor Device Test Set 6625143089164 enable JavaScript in your web browser . 5945-25-125
-6393Rele Reed5945251256393 251256393 90945569 191A STCRL7002-191A A capacitor whose capacitance value
6625-12-148-0446 Semiconductor Device Test Set PM6505ARNCC: 3 | RNVC: 1 | DAC: 3 30 May 1969 6625-14-308-9164
6625-14-328-2030 6625143282030 143282030 is an instrument which measures electric current and is calibrated and marked in amperes or any multiple and/or submultiple thereof. the value may be expressed by means of a pointer and calibrated dial or a digital readout display. for current detecting type of devices, see galvanometer.

6625-14-308-9164 Demil Restrictions 6625-14-308-9164

DEMIL: | DEMILI: | CRITICALITY: | HMIC: | PMIC: | EDC: | ADPEC:

6625-14-308-9164 is a Semiconductor Device Test Set

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