6625-14-259-1161
Semiconductor Device Test Set
6625142591161 142591161 101670 JX11 BE-166A
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
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NSN Created on 1 Jan 1969
Data Last Changed
January 2023
January 2023
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101670 JX11 BE-166A A test set specifically designed for use in making examinations of diodes, transistors
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Semiconductor Device Test Set 6625142591161 Assembly5998011471962 011471962 810-4-101670 https
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Approved Sources 6625-14-259-1161
- Part Number
- Manufacturer
- Status
- 101670
- Manufacturer
- F4050 - Bull Sas (Active)
- Primary Buy
- Primary Buy
- 101670
- F3608 - Automatisme Electronique (Cie (Cancelled)
- Canceled/Obsolete
- Canceled/Obsolete
- JX11
- F3608 - Automatisme Electronique (Cie (Cancelled)
- Canceled/Obsolete
- Canceled/Obsolete
- BE-166A
- F5312 - Cimd (Centre D'identification Des (Active)
- NATO Reference
- NATO Reference
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