6625-14-227-9229

Semiconductor Device Test Set

6625142279229 142279229 PM6505A U1550401 U155-04 TE-3A

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-227-9229 TEST SET,SEMICONDUCTOR DEVICE 6625142279229 142279229

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NSN Created on 1 Jan 1966
Data Last Changed
January 2023
NATO Update Count
1
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PM6505A NumberManufacturerStatusPM6505A C7158 - Fluke Deutschland Gmbh (Active) Incomplete Reference
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