6625-14-227-9228

Semiconductor Device Test Set

6625142279228 142279228 U1530101 301 U153-01 TE-2A

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-227-9228 TEST SET,SEMICONDUCTOR DEVICE 6625142279228 142279228

Managed by France
NSN Created on 1 Jan 1966
Data Last Changed
January 2023
NATO Update Count
1
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U1530101 301 U153-01 TE-2A A test set specifically designed for use in making examinations of diodes
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