6625-14-041-7352

Semiconductor Device Test Set

6625140417352 140417352 R301068G2031 BE-260A

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-14-041-7352 TEST SET,SEMICONDUCTOR DEVICE 6625140417352 140417352

Managed by France
NSN Created on 1 Jan 1974
Data Last Changed
January 2023
NATO Update Count
1
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NSN 6625-14-041-7352 (Generic Image) 1/1

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