6625-12-157-7028

Semiconductor Device Test Set

6625121577028 121577028 100-2656-02 BN2523 TDPBN2523 100265602 GUG23-00

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-12-157-7028 TEST SET,SEMICONDUCTOR DEVICE 6625121577028 121577028

Managed by Germany
NSN Created on 30 May 1969
Data Last Changed
January 2023
NATO Update Count
1
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6625-12-157-7028 Semiconductor Device Test Set 6625121577028
100-2656-02 BN2523 TDPBN2523 100265602 GUG23-00 A test set specifically designed for use in making examinations
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6625-12-157-7028 is a Semiconductor Device Test Set

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Part Number
Manufacturer
Status
100-2656-02
D0894 - Rohde & Schwarz Gmbh & Co. (Active)
Primary Buy
RNCC 3 RNVC 2 DAC 5
BN2523
D0894 - Rohde & Schwarz Gmbh & Co. (Active)
Secondary Buy
RNCC 5 RNVC 2 DAC 3
TDPBN2523
D0894 - Rohde & Schwarz Gmbh & Co. (Active)
Secondary Buy
RNCC 5 RNVC 2 DAC 6
100265602
D0894 - Rohde & Schwarz Gmbh & Co. (Active)
Canceled/Obsolete
RNCC 5 RNVC 9 DAC 9
GUG23-00
D0298 - Grundig - Hauptverwaltung Und (Replaced)
Canceled/Obsolete
RNCC 5 RNVC 9 DAC 9

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