6625-12-153-8396

Semiconductor Device Test Set

6625121538396 121538396 VG95211-ML-121538396 PM6505B 6625-01230

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

Managed by Germany

NSN Created on 30 May 1969

Data Last Changed
January 2023

NATO Update Count
1

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Restrictions 6625-12-153-8396

6625-12-153-8396 is a Semiconductor Device Test Set

End Users 6625-12-153-8396

Germany (ZG)

Approved Sources 6625-12-153-8396

Part Number
Manufacturer
Status
VG95211-ML-121538396: D3030 - Wehrtechnische Dienststelle Fur (Active); Definitive Standard; RNCC 2 RNVC 2 DAC 3
PM6505B: C7158 - Fluke Deutschland Gmbh (Active); Primary Buy; RNCC 3 RNVC 2 DAC 3
PM6505B: D2332 - Pma Prozess- Und (Active); Canceled/Obsolete; RNCC 5 RNVC 9 DAC 5
6625-01230: D3000 - Streitkraefteamt (Planungsnummer) (Active); NATO Reference; RNCC 6 RNVC 9 DAC 9

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