6625-21-897-9307
Semiconductor Device Test Set
6625218979307 218979307 IT3120
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
Managed by Canada
NSN Created on 15 Jan 1985
Data Last Changed
January 2023
January 2023
NATO Update Count
1
1
NATO Data Quality
Marketplace 6625-21-897-9307
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Related Documents 6625-21-897-9307 1+ Documents (More...)
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Semiconductor Device Test Set 6625218979307 RQST NE Updated Every Day 6625-21-897-9307 RQST Updated
6625-21-897-9307 1+ Documents ( More... ) https//www.nsnlookup.com /fsg-66/fsc-6625/ca 6625-21-897-9307
Semiconductor Device Test Set 6625218979307 RQST NE Updated Every Day 6625-21-897-9307 RQST Updated
Restrictions 6625-21-897-9307
End Users 6625-21-897-9307
- Canada (ZC)
Approved Sources 6625-21-897-9307
- Part Number
- Manufacturer
- Status
- IT3120
- Manufacturer
- 88273 - Heathkit Co Inc (Active)
- Primary Buy
- Primary Buy
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