6625-21-887-9449
Semiconductor Device Test Set
6625218879449 218879449 1M-30
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
Managed by Canada
NSN Created on 4 Jan 1982
Data Last Changed
January 2023
January 2023
NATO Update Count
1
1
NATO Data Quality
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Related Documents 6625-21-887-9449 1+ Documents (More...)
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Semiconductor Device Test Set 6625218879449 RQST NE Updated Every Day 6625-21-887-9449 RQST Updated
6625-21-887-9449 1+ Documents ( More... ) https//www.nsnlookup.com /fsg-66/fsc-6625/ca 6625-21-887-9449
Semiconductor Device Test Set 6625218879449 RQST NE Updated Every Day 6625-21-887-9449 RQST Updated
Restrictions 6625-21-887-9449
End Users 6625-21-887-9449
- Canada (ZC)
Approved Sources 6625-21-887-9449
- Part Number
- Manufacturer
- Status
- 1M-30
- Manufacturer
- 88273 - Heathkit Co Inc (Active)
- Primary Buy
- Primary Buy
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