6625-21-886-9372
Semiconductor Device Test Set
6625218869372 218869372 AFIT3500 00020-1 35000020-3
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
Managed by Canada
NSN Created on 3 Nov 1981
Data Last Changed
January 2023
January 2023
NATO Update Count
1
1
NATO Data Quality
Marketplace 6625-21-886-9372
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Related Documents 6625-21-886-9372 1+ Documents (More...)
AFIT3500 00020-1 35000020-3 A test set specifically designed for use in making examinations of diodes
RQST NE Updated Every Day 6625-21-886-9372 RQST Updated Every Day 6625-21-886-9372 RQST NE Related Documents
6625-21-886-9372 1+ Documents ( More... ) https//www.nsnlookup.com /fsg-66/fsc-6625/ca 6625-21-886-9372
RQST NE Updated Every Day 6625-21-886-9372 RQST Updated Every Day 6625-21-886-9372 RQST NE Related Documents
6625-21-886-9372 1+ Documents ( More... ) https//www.nsnlookup.com /fsg-66/fsc-6625/ca 6625-21-886-9372
Restrictions 6625-21-886-9372
End Users 6625-21-886-9372
- Canada (ZC)
Approved Sources 6625-21-886-9372
- Part Number
- Manufacturer
- Status
- AFIT3500
- Manufacturer
- 51089 - Fairchild Semiconductor Corp (Obsolete)
- Primary Buy
- Primary Buy
- 00020-1
- 51089 - Fairchild Semiconductor Corp (Obsolete)
- Secondary Buy
- Secondary Buy
- 35000020-3
- 51089 - Fairchild Semiconductor Corp (Obsolete)
- Secondary Buy
- Secondary Buy
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