6625-21-878-1995

Semiconductor Device Test Set

6625218781995 218781995 IT27

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-21-878-1995 TEST SET,SEMICONDUCTOR DEVICE 6625218781995 218781995

Managed by Canada
NSN Created on 7 Mar 1978
Data Last Changed
January 2023
NATO Update Count
1
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6695-01-447-4720 Instrument Mounting Bezel 6695014474720
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4130-01-423-5458 Demister Filter 4130014235458 014235458
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PL 19XL5353558CR IT27 Managed by United States NSN Created on 31 Dec 1995 Data Last Changed May 2023
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6625-21-878-1995 is a Semiconductor Device Test Set

6625-21-878-1995 End Users End Users 6625-21-878-1995

Canada (ZC)

6625-21-878-1995 Manufacturers Approved Sources 6625-21-878-1995

Part Number
Manufacturer
Status
IT27
88273 - Heathkit Co Inc (Active)
Primary Buy
RNCC 3 RNVC 2 DAC 4

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