6625-21-878-1995

Semiconductor Device Test Set

6625218781995 218781995 IT27

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

Managed by Canada

NSN Created on 7 Mar 1978

Data Last Changed
January 2023

NATO Update Count
1

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6625-21-878-1995 TEST SET,SEMICONDUCTOR DEVICE 6625218781995 218781995 1/1 — NSN 6625-21-878-1995 (Generic Image) 1/1

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6695-01-447-4720 Instrument Mounting Bezel 6695014474720

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