6625-21-878-1995

Semiconductor Device Test Set

6625218781995 218781995 IT27

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

Managed by Canada

NSN Created on 7 Mar 1978

Data Last Changed
January 2023

NATO Update Count
1

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6625-21-878-1995 TEST SET,SEMICONDUCTOR DEVICE 6625218781995 218781995 1/1 — NSN 6625-21-878-1995 (Generic Image) 1/1

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6625-21-878-1995 Semiconductor Device Test Set 6625218781995

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6695-01-447-4720 Instrument Mounting Bezel 6695014474720

G IT27 An item, usually in the form of a flanged rim, designed to fit over the front of a dial instrument
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5998-00-249-2219 Circuit Card Assembly 5998002492219 002492219

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4130-01-423-5458 Demister Filter 4130014235458 014235458

Upgrade 4130-01-423-5458Demister Filter4130014235458 014235458 02XB35017801 02XB3501-7801 CAT19.019 IT27
PL 19XL5353558CR IT27 INC: 77777 Managed by United States NSN Created on 31 Dec 1995 Data Last Changed
5458 Demister Filter 4130014235458014235458 02XB3501780102XB3501-7801CAT19.019 IT27PL 19XL5353558CR IT27