6625-21-112-3090
Semiconductor Device Test Set
6625211123090 211123090
Cancelled - Replaced by NSN 6625-00-893-2628
A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set
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Data Last Changed
January 2024
January 2024
NATO Update Count
1
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Related Documents 6625-21-112-3090 3+ Documents (More...)
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