6625-20-004-5867

Semiconductor Device Test Set

6625200045867 200045867 SMART TWEEZERS

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-20-004-5867 TEST SET,SEMICONDUCTOR DEVICE 6625200045867 200045867

Managed by Canada
NSN Created on 18 Feb 2009
Data Last Changed
January 2023
NATO Update Count
1
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