6625-13-800-1750

Semiconductor Device Test Set

6625138001750 138001750 H6-1

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

Managed by Belgium

NSN Created on 1 Apr 1975

Data Last Changed
January 2023

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1

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