6625-13-800-1750

Semiconductor Device Test Set

6625138001750 138001750 H6-1

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-13-800-1750 TEST SET,SEMICONDUCTOR DEVICE 6625138001750 138001750

Managed by Belgium
NSN Created on 1 Apr 1975
Data Last Changed
January 2023
NATO Update Count
1
NATO Data Quality
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6625-13-800-1750 is a Semiconductor Device Test Set

6625-13-800-1750 Manufacturers Approved Sources 6625-13-800-1750

Part Number
Manufacturer
Status
H6-1
K0322 - Telequipment Ltd (Replaced)
Primary Buy
RNCC 3 RNVC 2 DAC 6
H6-1
K3359 - Grundy And Partners Ltd (Replaced)
Primary Buy
RNCC 3 RNVC 2 DAC 4

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