6625-13-800-1750

Semiconductor Device Test Set

6625138001750 138001750 H6-1

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-13-800-1750 TEST SET,SEMICONDUCTOR DEVICE 6625138001750 138001750

Managed by Belgium
NSN Created on 1 Apr 1975
Data Last Changed
January 2023
NATO Update Count
1
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6625-13-110-5503 Cathode Ray Tube Scale 6625131105503
Instruments from Belgium (BE) 1975 6625-13-110-5503 https//www.nsnlookup.com /fsg-66/fsc-6625/be 6625-13-800-1750
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Electrical and Electronic Properties Measuring and Testing Instruments from Belgium (BE) 1976 6625-13-800-1750
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6625-13-110-4838 Ammeter 6625131104838 131104838,7623689
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Semiconductor Device Test Set 6625138001750 Instruments from Belgium (BE) 1976 6625-13-800-1750
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Electrical and Electronic Properties Measuring and Testing Instruments from Belgium (BE)
2 | DAC: 4 7 Jan 1997 6625-13-110-4838 Ammeter 7623689RNCC: 3 | RNVC: 2 | DAC: 3 28 Jul 1976 6625-13-800-1750

6625-13-800-1750 Demil Restrictions 6625-13-800-1750

DEMIL: | DEMILI: | CRITICALITY: | HMIC: | PMIC: | EDC: | ADPEC:

6625-13-800-1750 is a Semiconductor Device Test Set

6625-13-800-1750 Manufacturers Approved Sources 6625-13-800-1750

Part Number
Manufacturer
Status
H6-1
K0322 - Telequipment Ltd (Replaced)
Primary Buy
RNCC 3 RNVC 2 DAC 6
H6-1
K3359 - Grundy And Partners Ltd (Replaced)
Primary Buy
RNCC 3 RNVC 2 DAC 4

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